| Publication info |
|---|
| | |
| Publication type | Publication in a journal |
| Publication kind | Conference article |
| Publication title | High resolution X-ray diffraction defect structure characterization in Si-doped and undoped GaN films |
| Web URL | |
| Journal title | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY |
| Media type | |
| Volume | 91-92 |
| Book | |
| Publication year | 2002 |
| From page | 441 |
| To page | 444 |
| Publication number | |
| Publication language | English |
| Ethnic language of studied culture | |
| Range | international |
| Report year | 2002 |