Study of Si-implanted and thermally annealed layers of silicon by using X-ray grazing incidence methods
Publication info
Publication type
Publication in a journal
Publication kind
Conference article
Publication title
Study of Si-implanted and thermally annealed layers of silicon by using X-ray grazing incidence methods
Web URL
http:////przyrbwn.icm.edu.pl//APP//ABSTR//101//a101-5-795.html
Journal title
ACTA PHYSICA POLONICA A
Media type
printed publication
Volume
101
Book
5
Publication year
2002
From page
795
To page
801
Publication number
Publication language
English
Ethnic language of studied culture
Range
international
Report year
2002
Authors list
1.
D Klinger,
External unit
[
Co-author
]
2.
Maria Lefeld-Sosnowska
,
Wydział Fizyki
[
Co-author
]
3.
J Pełka,
External unit
[
Co-author
]
4.
W Paszkowicz,
External unit
[
Co-author
]
5.
P Gierłowski,
External unit
[
Co-author
]
6.
P Paszkowski,
External unit
[
Co-author
]