Study of Si-implanted and thermally annealed layers of silicon by using X-ray grazing incidence methods

Publication info
  
Publication typePublication in a journal
Publication kindConference article
Publication titleStudy of Si-implanted and thermally annealed layers of silicon by using X-ray grazing incidence methods
Web URLhttp:////przyrbwn.icm.edu.pl//APP//ABSTR//101//a101-5-795.html
Journal titleACTA PHYSICA POLONICA A
Media typeprinted publication
Volume101
Book5
Publication year2002
From page795
To page801
Publication number
Publication languageEnglish
Ethnic language of studied culture
Rangeinternational
Report year2002

Authors list
  
 1. D Klinger, External unit [Co-author]
 2. Maria Lefeld-Sosnowska, Wydział Fizyki [Co-author]
 3. J Pełka, External unit [Co-author]
 4. W Paszkowicz, External unit [Co-author]
 5. P Gierłowski, External unit [Co-author]
 6. P Paszkowski, External unit [Co-author]